Compute S-parameters versus frequency in EMWORKS for connectors, filters, transmission lines, antennas and PCB interconnects.
The S-parameters solver in EMWORKS computes scattering parameters for multi-port RF and high-speed structures. It works on 3D models defined in the RF & MICROWAVES module to describe how signals are transmitted, reflected and coupled between ports over frequency.
Typical uses include characterizing antennas, filters, connectors, transitions, transmission lines and PCB interconnects where geometry and materials strongly influence matching and loss.
Multi-port network characterization
Compute the full S-parameter matrix for 2-port and multi-port devices across a defined frequency sweep.
Frequency-dependent behaviour
Study how insertion loss, return loss and coupling vary with frequency to confirm bandwidth and matching requirements.
Flexible port definition
Set up wave ports, lumped ports or other supported port types to represent coaxial feeds, microstrip launches, stripline, waveguides and similar terminations.
Support for complex geometries
Use the EMWORKS built-in CAD environment or imported models to include connectors, packages, cut-outs and housing details in the analysis when needed.
S-parameters analysis in EMWORKS is typically applied to:
Connectors and transitions – Coax launches, board-to-board connectors, coax-to-microstrip or stripline transitions
Filters – Waveguide, cavity and planar filters where passband, stopband and matching must be confirmed
Transmission lines – Microstrip, stripline and other controlled-impedance structures on PCBs or in packages
Chip-package-board paths – Signal paths spanning IC package, vias and PCB traces
Waveguide and cavity components – Junctions, couplers and other passive structures
Passive RF components – Couplers and related structures where S-parameters describe the intended function
S-parameters analysis in EMWORKS provides numerical and field-level results commonly used in RF and signal-integrity work, including:
Generalized S-parameters matrix over the specified frequency range
Derived quantities such as insertion loss, return loss, isolation and VSWR
Re-normalized S-parameters matrix when a different reference impedance is needed
Impedance and admittance matrices
Propagation parameters at each port
Impedances at each port
Electric field distribution around ports and critical features
Magnetic field distribution around ports and critical features
These results can be exported for use in circuit simulators or for further post-processing alongside measurements.